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Library -- 2000 - 2009
2004-2005
00-01
02-03 04-05
06-07
- Schmid, Gerard M.; Stewart, Michael D.; Burns, Sean
D.; Willson, C. Grant. “Mesoscale Monte Carlo Simulation of
Photoresist Processing.” J. Electrochemical Soc. 151 (2), (2004).
- Yamada, Shintaro; Mrozek, Thomas; Rager, Timo; Owens,
Jordan; Rangel, Jose; Willson, C. Grant; Byers, Jeffery. “Toward
Environmentally Friendly Photolithographic Materials: A New Class of
Water-Soluble Photoresists.” Macromolecules 37(2), 377-384, (2004).
- Kim, Eui K.; Stacey, N.A.; Smith, B. J.; Dickey, M.D.,
Johnson, S.C.; Trinque, B.C.; Willson, C. G. “Vinyl Ethers in
Ultraviolet Curable Formulations for Step and Flash Imprint
Lithography” Jour. Vac. Sci. & Tech., B: Microelectronics and
Nanometer Structures—Processing, Measurement, and Phenomena, 22,
131-135 (2004).
- Chambers, C. R.; Kusumoto, S.; Osborn, B. P.; Vasudeve,
A.; Ootani, M.; Walthal, L.; McMichael, H.; Zimmerman, P. A.;
Conley, W. E.; Willson, C. G. “Design of dissolution inhibitors for
chemically amplified photolithographic systems” Proc. SPIE, 5376,
360-368 (2004).
- Taylor, J. C.; Chambers, C. R.; Deschner, Ryan; LeSuer,
R. J.; Conley, W. E.; Burns, S. D.; Willson, C. G. “Implications of
immersion lithography on 193nm photoresists. Proc. SPIE, 5376, 34-43
(2004).
- Tatersall, P. I.; Breslin, D.; Grayson, S. M.; Heath,
W. H.; Lou, K.; McAdams, C.L.; McKean, D.; Rathsack, B. M.; Willson,
C. G.; “Synthesis and Properties of Diazopiperidiones for Use in
Nonchemically Amplified Deep UV Photoresists,” Chem. Mater., 16(9),
1770-1774 (2004).
- Leeson, M. J.; Yueh, W.; Tattersall, P. I.; Pawloski,
A.; Grayson, S. M.; Willson, C. G. “Synthesis and Reactivity of
3-Diazo-4-oxocoumarins for Photolithographic Applications” Chem.
Mater., 16(9), 1763-1769 (2004).
- LeSuer, R. J.; Fan, F. F.; Bard, A. J.; Taylor, C.;
Tsiartas, P.; Willson, C. G.; Conley, W.; Feit, G.; Kunz, R. “Using
scanning electrochemical microscopy t probe chemistry at the
solid-liquid interface in chemically amplified immersion
lithography,” Proc. SPIE, 5376, 115-125 (2004).
- Schmid, G.M.; Stewart, M. D.; Wang, C. Y.; Vogt, B.
D.; Prabhu, V. M.; Lin, E. K.; Willson, C. G. “Resolution
limitations in chemically amplified photoresist systems” Proc SPIE,
5376, 333-341 (2004).
- Colburn, Matthew; Choi, Byung Jin; Sreenivasan, S.V.;
Bonnecaze, Roger T.; Willson, C. Grant. “Ramifications of
Lubrication Theory on Imprint Lithography,” Microelectronic
Engineering 75(3), 321-329 (2004).
- Burns, R. L.; Johnson, S. C.; Schmid, G. M.; Kim, E.
K.; Dickey, M. D.; Meiring, J.; Burns, S. D.; Stacey, N. A.; Willson,
C. G. “Mesoscale modeling for SFIL simulating polymerization
kinetics and densification,” Proc. SPIE, 5374, 348-360 (2004).
- Xu, F.; Stacey, N.; Watts, M.; Truskett, V.; McMackin,
I.; Choi, Jin; Schumaker, P.; Thompson, E.; Babs, D.; Sreenivasan,
S.V.; Willson, C. G.; Schumaker, N. “Development of Imprint
Materials for the Step and Flash Imprint Lithography Process,” Proc.
SPIE, 5374, 232-241 (2004).
- Michaelson, Timothy, Jamieson, Andrew; Pawloski, Adam
R.; Byers, Jeffrey; Acheta, Alden; Willson, C. Grant. “Understanding
the Role of Base Quenchers in Photoresists” SPIE 5376, 1282-1293
(2004).
- Jones, Ronald L.; Hu, Tengjiao; Lin, Eric K.; Wu, Wen-Li;
Goldfarb, Dario L.; Angelopoulos, Marie; Trinque, Brian; Schmid,
Gerard M.; Stewart, Michael D.; Willson, C. Grant. “Formation of
Deprotected Fuzzy Blobs in Chemically Amplified Resists,” Journal of
Polymer Science, Part B: Polymer Physics, 42, 3063-3069 (2004).
- Yan, X.; Liu, G.; Dickey, M.; Willson, C. G.
“Preparation of Porous Polymer Membranes Using Nano- or Micro-pillar
Arrays as Templates” Polymer 45, 8469-8474 (2004).
- Meiring, J. E.; Schmid, M. J.; Grayson, S. M.;
Rathsack, B. M.; Johnson, D. M.; Kirby, R.; Kannappan, R.; Manthiram,
K.; Hsia, B.; Hogan, Z. L.; Ellington, A. D.; Pishko, M. V. and
Willson, C. G. “Hydrogel Biosensor Array Platform Indexed by Shape,”
Chem. Mater. 16, 5574-5580 (2004).
- Tattersall, P. I.; Breslin, D.; Grayson, S.; Heath,
W.; Lou, K.; McAdams, C.; McKean, D.; Rathsack, B.; Yueh, Wang;
Willson, C. G. “Synthesis and Properties of Diazopiperidiones for
use in Non-Chemically Amplified Deep UV Resists,” Chem. Matl. 16(9),
1770-1774 (2004).
- Jamieson, A. T.; Willson, C. G.; Brodie, A.; Hsu, Y.
“Low voltage Electron Beam Lithography Resist Processes: Top Surface
Imaging and Hydrogen Silisequioxane Bilayer” JM3, 3(3), pp. 442-449
(2004).
- Dickey, M. D.; Stewart, M. D.; Willson, C. G. “An
Automated Statistical Process Control Study of Inline Mixing Using
Spectrophotemetric Detection” Jour. of Chem. Ed. (xxxx).
- Resnick, Douglas J.; Sreenivasan, S.V.; Willson, C.
Grant. “Step and Flash Imprint Lithography” Materials Today,
February 2005, p. 34-42.
- Yan, Xiaohu Yan; Liu, Guojun; Dickey, Michael; Willson,
C. Grant. “Preparation of porous polymer membranes using nano- or
micro-pillar arrays as templates” Polymer 45, 8469-8474 (2004).
- Schmid, Gerard; Burns, Sean; Stewart, Michael;
Stewart, Michael; Tsiartas, Pavlos; Meiring, Jason; and Willson, C.
Grant. “Mesoscale Monte Carlo simulation of positive-tone,
chemically amplified photoresist processing” Polym. Mater. Sci.
Eng., 90, 285-286 (2004).
- Dickey, Michael; Willson, C. G. “Effects of oxygen on
step and flash imprint lithography photopolymerization kinetics”
Polym. Mater. Sci. Eng. 90, 24-25 (2004)
- Johnson, Heather; Ozair, Sahban; Winters, Kristina;
Willson, C. G. “Designing materials for cationic graft lithography,
Polym. Mater. Sci. Eng., 42, 3063-3069 (2004).
- Rathsack, Benjamin; Medeiros, David; Willson, C. Grant
“Resists for Mask Making” (Chapter 15) Handbook of PHotomask
Manufacturing Technology. CRC Press, ISBN 0-8247-5274-7 (2005).
- Gates, B. D.; Xu, Q.; Stewart, M.; Deschner, R.;
Willson, C. G.; Whitesides, G. M. “New Approaches to
Nanofabrication: Molding, Printing, and Other Techniques,” Chem.
Rev. 105, 1171-1196 (2005).
- Stewart, M D.; Johnson, S. C.; Sreenivasan, S. V.;
Resnick, D. J.; Willson, C. G. “Nanofabrication with step and flash
imprint lithography” J. Microlith., Microfab., Microsyst. 4(1),
011002 (2005).
- Michaelson, Tim; Pawloski, Adam; Acheta, Alden;
Nishimura, Yukio; Willson, C. G. “The effects of chemical gradients
and photoresist composition on lithographically generated line edge
roughness,” SPIE 5753 pp. 368-379 (2005).
- Meiring, Jason; Michaelson, Timothy B.; Jamieson,
Andrew; Schmid, Gerard M.; Willson, C. Grant “Using Mesoscale
Simulation to Explore Photoresist Line Edge Roughness” SPIE 5753
pp.350-360 (2005).
- Taylor, J. Christopher; Shayib, Ramzy; Goh, Sumarlin;
Chambers, Charles R.; Conley, Will; Lin, Shang-Ho; Willson, C.
Grant. “Fluids and resists for hyper NA immersion lithography,” SPIE
5753, pp. 836-846.
- Conley, Will; LeSuer, Robert J.; Fan, Frank F.; Bard,
Allen J.; Taylor, Chris; Tsiartas, Pavlos; Willson, C. Grant;
Romano, Andrew; Dammel, Ralph. “Understanding the Photoresist
Surface-Liquid Interface for ArF Immersion Lithography,” SPIE, 5753,
pp. 64-77 (2005).
- Kim, E. K.; Ekerdt, J. E.; Willson, C. G. “Importance
of evaporation in the design of materials for step and flash imprint
lithography,” J. Vac Sci. Technol. B 23(4) (2005)
- Kim, E. K.; Stewart, M. D.; Wu, K.; Palmieri, F.L.;
Dickey, M. D.; Ekerdt, J. G. and Willson, C. G. “Vinyl Ether Formulations for Step and
Flash Imprint Lithography,’ J. Vac. Sci. Technol. B 23(6), pp. 2967-2971 (2005)
- Wu, K.; Bailey, T. C.; Willson, C. G.; Ekerdt,
J. G. “Surface Hydration and Its Effect on Fluorinated SAM Formation on SiO2 Surfaces,”
Langmuir, 21, pp. 11795-11801 (2005).
- Johnson, S.; Burns, R.; Kim, E. K.; Dickey, M.;
Schmid, G.; Meiring, J.; Burns, S.; Willson, C. G. “Effects of etch barrier densification on step
and flash imprint lithography,” J. Vac. Sci. Technol. B 23(6), pp. (2005).
- Stewart, Michael D.; Willson, C. Grant.
“Imprint Materials for Nanoscale Devices,” MRS Bulletin 30, pp. 947-951 (2005).
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