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2003 |
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S.C. Johnson, T.C. Bailey, M.D.
Dickey, E.K. Kim, B.J. Smith, N.A. Stacey, J.G. Ekerdt, C.G. Wilson,
A.T. Jamieson, D.J. Resnick, D.P. Mancini, W.J. Dauksher, K.J.
Nordquist, Step and Flash Imprint Lithography: Materials and
Process Developments, Proc. SPIE 5037: submitted (2003).
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B.J. Smith, N.A. Stacey, J.P.
Donnelly, D.M. Onsongo, T.C. Bailey, C.J. Mackay, S.V. Sreenivasan,
S.K. Banerjee, J.G. Ekerdt, C.G. Willson,
Employing Step and
Flash Imprint Lithography for Gate Level Patterning of a MOSFET
Device, Proc SPIE 5037: submitted (2003).
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T.C. Bailey, M.E. Colburn, B.J. Choi,
A. Grot, J.G. Ekerdt, S.V. Sreenivasan, C.G. Willson, Step and
Flash Imprint Lithography: A Low-Pressure, Room Temperature
Nanoimprint Patterning Process, in
Alternative Lithography. Unleashing the Potentials of Nanotechnology,
C. Sotomayor Torres, Editor. 2002, Elsevier.
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2002 |
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C.J. Mackay,
Development of a Baseline
Process for the Integration of Step and Flash Imprint Lithography into a
MOSFET Fabrication Process. Department of Mechanical
Engineering: M.S. Thesis. 2002, The University of Texas at Austin:
Austin, TX.
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T.C. Bailey, S.C. Johnson, M.D. Dickey, B.J. Smith, A.T. Jamieson, E.K.
Kim, N.A. Stacey, D. Mancini, W.J. Dauksher, K. Nordquist, D.J. Resnick,
S.V. Sreenivasan, J.G. Ekerdt and C.G. Willson. "Recent Advances in Step
and Flash Imprint Lithography." Proc. 39th Interface
Symposium: (2002).
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T.C. Bailey, S.C. Johnson,
D.J. Resnick, S.V.
Sreenivasan, J.G. Ekerdt, C.G. Willson. "Step and Flash Imprint
Lithography: An Efficient Nanoscale Printing Technology." J.
Photopolymer Sci. Tech. 15(3): 481 (2002).
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D.J. Resnick, T.C. Bailey, W.J.
Dauksher, D. Mancini, K.J. Nordquist, E. Ainley, K. Gehoski, J.H. Baker,
S. Johnson, M. Meissl, S.V. Sreenivasan, J.G. Ekerdt and C.G. Willson.
"High Resolution Templates for Step and Flash Imprint Lithography."
Proc. SPIE 4688: 205 (2002).
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W.J. Dauksher, K.J. Nordquist,
D.P. Mancini, D.J. Resnick, J.H. Baker, A.E. Hooper, A.A. Talin, T.C.
Bailey, A.M. Lemonds, S.V. Sreenivasan, J.G. Ekerdt and C.G. Willson.
"Characterization of and Imprint Results using ITO-based Step and Flash
Imprint Lithography Templates." J. Vac. Sci. Tech. B 20(6):
2857-2861 (2002).
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D.P. Mancini, K.A. Gehoski,
E.Ainley, K.J. Nordquist, D.J. Resnick, T.C. Bailey, S.V. Sreenivasan,
J.G. Ekerdt and C.G. Willson. "Hydrogen Silsesquioxane for Direct E-beam
Patterning of Step and Flash Imprint Lithography Templates." J. Vac.
Sci. Tech. B 20(6): 2896-2901 (2002).
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S.V. Sreenivasan, C.G. Willson,
N.E. Schumaker and D.J. Resnick. "Cost of Ownership Analysis for
Patterning Using Step and Flash Imprint Lithography." Proc. SPIE: Proc. SPIE
4688: (2002).
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D.J. Resnick, D.P. Mancini, S.V.
Sreenivasan and C.G. Willson. "Release Layers for Contact and Imprint
Lithography." Semiconductor International (June 1): (2002).
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2001 |
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M.E.
Colburn, Step and Flash Imprint
Lithography: A Low-Pressure, Room-Temperature Nanoimprint Lithography.
Department of Chemical Engineering; Ph.D. Thesis. 2001, The University
of Texas at Austin: Austin, TX.
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A.Q.
Nguyen, Asymmetric Fluid-Structure Dynamics
in Nanoscale Imprint Lithography. Department of Mechanical
Engineering: M.S. Thesis. 2001, The University of Texas at Austin:
Austin, TX.
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M. Colburn, T. Bailey, B.J. Choi,
J.G. Ekerdt, S.V. Sreenivasan and C.G. Willson. "Development and
advantages of step and flash imprint lithography." Solid State
Technology 46(7): 67 (2001).
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T. Bailey, B.J. Smith, B.J. Choi,
M. Colburn, M. Meissl, S.V. Sreenivasan, J.G. Ekerdt and C.G. Willson.
"Step and Flash Imprint Lithography: Defect Analysis." J. Vac. Sci.
Tech. B 19(6): 2806 (2001).
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T.C. Bailey, D.J. Resnick, D.
Mancini, K.J. Nordquist, W.J. Dauksher, E. Ainley, A. Talin, K. Gehoski,
J.H. Baker, B.J. Choi, S. Johnson, M. Colburn, M. Meissl, S.V.
Sreenivasan, J.G. Ekerdt and C.G. Willson. "Template Fabrication Schemes
for Step and Flash Imprint Lithography." Microelectron. Eng.
61-62: 461 (2001).
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B.J. Choi, M. Meissl, M. Colburn,
T. Bailey, P. Ruchhoeft, S.V. Sreenivasan, F. Prins, S. Banerjee, J.G.
Ekerdt and C.G. Willson. "Layer-to-Layer Alignment for Step and Flash
Imprint Lithography." Proc. SPIE 4343: 436-439 (2001).
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B.J. Choi, S. Johnson, M.
Colburn, S.V. Sreenivasan and C.G. Willson. "Design of orientation
stages for step and flash imprint lithography." Precision Engineering
25(3): 192 (2001).
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M. Colburn, A. Grot, B.J. Choi,
M. Amistoso, T. Bailey, S.V. Sreenivasan, J.G. Ekerdt and C.G. Willson.
"Patterning non-flat substrates with a low pressure, room temperature
imprint lithography process." J. Vac. Sci. Tech. B 19(6):
2162 (2001).
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M. Colburn, I. Suez, B.J. Choi,
M. Meissl, T. Bailey, S.V. Sreenivasan, J.G. Ekerdt and C.G. Willson.
"Characterization and Modeling of Volumetric and Mechanical Properties
for Step and Flash Imprint Lithography Photopolymers." J. Vac. Sci.
Tech. B. 19(6): 2685 (2001).
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2000 |
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M. Colburn, A. Grot, M. Amistoso,
B.J. Choi, T. Bailey, J. Ekerdt, S.V. Sreenivasan, J. Hollenhorst and
C.G. Willson. "Step and Flash Imprint Lithography for sub-100nm
Patterning." Proc. SPIE 3997: 453 (2000).
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T. Bailey, B.J. Choi, M. Colburn,
A. Grot, M. Meissl, S. Shaya, J.G. Ekerdt, S.V. Sreenivasan and C.G.
Willson. "Step and Flash Imprint Lithography: Template surface treatment
and defect analysis." J. Vac. Sci. Tech. B 18(6): 3572
(2000).
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T. Bailey, B.J. Choi, M. Colburn,
A. Grot, M. Meissl, M. Stewart, J.G. Ekerdt, S.V. Sreenivasan and C.G.
Willson. "Step and Flash Imprint Lithography: A Technology Review."
Future Electron Devices 11(4): 54 (2000).
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B.J. Choi, S. Johnson, S.V.
Sreenivasan, M. Colburn, T. Bailey and C.G. Willson. "Partially
Constrained Compliant Stages for High Resolution Imprint Lithography."
Proc. ASME DETC2000 7B: 861 (2000).
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1999 |
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S.C. Johnson, Selectively Compliant
Orientation Stages for Step and Flash Imprint Lithography,
Department of Mechanical Engineering; M.S. Thesis. 1999, The University
of Texas at Austin: Austin, TX.
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M. Colburn, S. Johnson, M.
Stewart, S. Damle, T. Bailey, B. Choi, M. Wedlake, T. Michaelson, S.V.
Sreenivasan, J.G. Ekerdt and C.G. Willson. "Step and Flash Imprint
Lithography: A new approach to high resolution patterning." Proc.
SPIE 3676(I): 379 (1999).
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P. Ruchoeft, M. Colburn, B. Choi,
H. Noinu, S. Johnson, T. Bailey, S. Damle, M. Stewart, J.G. Ekerdt, S.V.
Sreenivasan, J.C. Wolfe and C.G. Willson. "Patterning curved surfaces:
Template generation by ion beam proximity lithography and relief
transfer by Step and Flash Imprint Lithography." J. Vac. Sci. Tech. B
17(6): 2965 (1999).
Related Publications |
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D.P. Mancini, D.J. Resnick, K.A.
Gehoski, L.L. Popovich and D.Y. Chang. "Low surface energy polymeric
release coating for improved contact print lithography." Proc. SPIE:
21st Annual BACUS Symposium on Photomask Technology 4562:
593-599 (2001).
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C.J. Martin, R.L. Engelstad, E.G.
Lovell, D.J. Resnick and E.J. Weisbrod. "Prediction of fabrication
distortions in step and flash imprint lithography templates." J. Vac.
Sci. Tech. B 20(6): 2891-2895 (2002).
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