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Willson Research Group - The University of Texas at Austin

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Lithographic Optimization

Lithographic Imaging Equation

 

1. Image Transfer 
Position steepest slope (inflection point) of the aerial
image at the feature edge

 

  


2. Dissolution Contrast
Maximize dissolution change with dose through R(m) analysis of photoresists

 





3. Dissolution Threshold
Position the dissolution threshold at the inflection point
of the image with developer concentration

 

R = Dissolution rate
x = Horizontal position
m = Relative PAC concentration

g
R = Resist contrast
x* = Nominal edge of resist features


Last updated Monday, February 14, 2000
© 2000 Photomask Lithography, Willson Research Group,
University of Texas at Austin
Phone: 512.471.6364
Email:
rathsack@mail.utexas.edu

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